发明名称 Test device and test module
摘要 A test device for testing an electronic device having a plurality of device terminals that receive a signal, includes: an operating condition outputting unit for outputting an operating condition indicating an operation of a signal to be supplied to a device terminal to be associated with said device terminal; and a test module for supplying a test signal used in a test of the electronic device to the electronic device based on the operation indicated by the operating condition. The test module includes: a plurality of module terminals, each of which is electrically connected to any of the device terminals, for supplying the test signal to the device terminals, respectively; a terminal correspondence storing unit for storing terminal correspondence information indicating correspondence between each device terminal and a module terminal connected to that device terminal; and an operating setting unit for selecting a module terminal connected to the device terminal associated with the operating condition based on the terminal correspondence information, and setting the operating condition for the selected module terminal.
申请公布号 US6992576(B2) 申请公布日期 2006.01.31
申请号 US20040930554 申请日期 2004.08.31
申请人 ADVANTEST CORPORATION 发明人 WASHIZU NOBUEI
分类号 G08B29/00;G01R31/319 主分类号 G08B29/00
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