发明名称 Defocus-invariant exposure for regular patterns
摘要 For a 2-dimensional periodic array of contact holes or islands, a depth-of-focus-enhancement lithographic scheme based on a combination of alternating phase-shifting mask and off-axis illumination is revealed. The scheme is achieved by choosing appropriate off-axis illumination and smaller numerical aperture such that only two diffraction orders, which are of equal distance from the pupil center, are collected in the first exposure. The image of the 2-dimensional periodic array can be formed by superposing a second exposure on the first. In the second exposure, another appropriate off-axis illumination and smaller numerical aperture is chosen such that another two diffraction orders, which are also of equal distance from the pupil center, are collected.
申请公布号 US6991895(B1) 申请公布日期 2006.01.31
申请号 US20020224186 申请日期 2002.08.20
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD. 发明人 YEN ANTHONY;YU SHINN-SHENG
分类号 G03F7/00 主分类号 G03F7/00
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