发明名称 Deep well implant structure providing latch-up resistant CMOS semiconductor product
摘要 A CMOS semiconductor product employs a first doped well of a first polarity and a second doped well of a second polarity opposite the first polarity, each formed laterally separated within a semiconductor substrate. The first doped well is further embedded within a third doped well of the second polarity that further separates the first doped well from the second doped well. The third doped well provides latch-up resistance for a pair of MOS transistors formed within the first doped well and the second doped well.
申请公布号 US6992361(B2) 申请公布日期 2006.01.31
申请号 US20040761658 申请日期 2004.01.20
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD. 发明人 SHIN JIAW-REN;LEE JIAN-HSING;CHEN SHUI-HUNG
分类号 H01L29/00;H01L21/8238;H01L27/092 主分类号 H01L29/00
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