发明名称 Testing resistance bolometer arrays
摘要 A method of testing resistance bolometer arrays involves applying different voltages to different bolometers so as to produce a detectable difference between adjacent bolometers under normal conditions. The voltages may be applied in a recognizable pattern so that faults can be readily identified from a visual display of the array.
申请公布号 US6992291(B2) 申请公布日期 2006.01.31
申请号 US20020097482 申请日期 2002.03.14
申请人 INFRARED INTEGRATED SYSTEMS LIMITED 发明人 PORTER STEPHEN GEORGE;FOX JOHN;SINGH BHAJAN
分类号 G01J5/20;G01J5/24;G01J5/52 主分类号 G01J5/20
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