发明名称 |
Testing resistance bolometer arrays |
摘要 |
A method of testing resistance bolometer arrays involves applying different voltages to different bolometers so as to produce a detectable difference between adjacent bolometers under normal conditions. The voltages may be applied in a recognizable pattern so that faults can be readily identified from a visual display of the array.
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申请公布号 |
US6992291(B2) |
申请公布日期 |
2006.01.31 |
申请号 |
US20020097482 |
申请日期 |
2002.03.14 |
申请人 |
INFRARED INTEGRATED SYSTEMS LIMITED |
发明人 |
PORTER STEPHEN GEORGE;FOX JOHN;SINGH BHAJAN |
分类号 |
G01J5/20;G01J5/24;G01J5/52 |
主分类号 |
G01J5/20 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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