| 摘要 |
AN IC TESTING APPARATUS(1) EXCELS IN GIVING A DUT A UNIFIED PRESS FORCE TOWARD A CONTACTPORTION(40,50), WHICH CARRIES OUT A TEST BY PRESSING INPUT/OUTPUT TERMINALS OF THE DUT AGAINTS CONTACT PINS (51) OF A TEST HEAD, AND COMPRISES A PUSHER BASE (34) PROVIDED MOVABLY AND CLOSE TO BUT AWAY FROM THE CONTACT PINS (51), A PUSHER BLOCK (31) MOUNTED ON THE PUSHER BASE FOR PRESSING THE DUT, AND A SPRING (36) FOR GIVING AN ELASTIC FORCE TO THE PUSHER BLOCK IN THE PRESSING DIRECTION.FIG 9
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