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发明名称
An apparatus for ultrasonic inspection of flawed materials
摘要
申请公布号
SG118100(A1)
申请公布日期
2006.01.27
申请号
SG20010007295
申请日期
2001.11.23
申请人
SINGAPORE TECHNOLOGIES AEROSPACE LTD.;GINTIC INSTITUTE OF MANUFACTURING TECHNOLOGY
发明人
LIM SER YONG;BRIAN STEPHEN WONG;SEETHA RAGHAVAN
分类号
(IPC1-7):G01N29/04
主分类号
(IPC1-7):G01N29/04
代理机构
代理人
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地址
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