Device for testing circuit unit with increased clock frequency has device for switching connection device between normal and frequency doubling modes with clock signal and frequency doubled clock signal fed to circuit unit respectively

摘要

The device has a test system that provides a clock signal for controlling and conducting a test and a connecting device (200) for electrically connecting the test system to the circuit unit with a frequency doubling unit (201) for doubling the clock frequency of the clock signal fed to the connecting device and for outputting a frequency doubled clock signal to the circuit unit, a changeover device (202,203) for switching the connection device between a normal mode in which the test signal is forwarded to the circuit unit and a frequency doubling mode in which the clock signal fed to the connecting device is doubled in frequency and fed to the circuit unit. An independent claim is also included for a method of testing a circuit unit with an increased clock frequency.