发明名称 MICROSCOPE AND MICROSCOPE SYSTEM
摘要 PROBLEM TO BE SOLVED: To provide a microscope designed so that while an eye-piece lens or a display device is observed, the relative positions of an objective lens and a specimen placed on a stage can be checked. SOLUTION: A mirror 15 is disposed facing the side of a stage 7. A mirror 16 is disposed above the mirror 15. Observation light L2 representing the relative positions of the specimen 8 and the objective lens 5 is reflected in the direction of the mirror 16 by the mirror 15 and then enters an optical-path switch mirror 17. The optical-path switch mirror 17 allows the incident observation light L2 to pass through it as it is or allows the incident observation light 12 to reflect in the direction of an eye-piece lens barrel 4. By setting the optical-path switch mirror 17 to a reflecting state, the observation light L2 is guided to the eye-piece lens 11 by the optical-path switch mirror 13. This enables an observer 14 to observe the relative distance between the specimen 8 and objective lens 5 through the eye-piece lens 11. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006023493(A) 申请公布日期 2006.01.26
申请号 JP20040200891 申请日期 2004.07.07
申请人 NIKON CORP 发明人 SASAKI YUTAKA
分类号 G02B21/00;G02B7/04 主分类号 G02B21/00
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