| 摘要 |
PROBLEM TO BE SOLVED: To enable an easy exchange of a connecting part even if the connecting part is worn out, by making the connecting part replaceable and removable, and moreover to enable the evaluation of a high bit-rate device too by suppressing changes in conditions determining a characteristic impedance. SOLUTION: A test fixture 20 forming a device inspection apparatus 1 for attaching a device 10 to and evaluating its performance, is equipped with a main substrate 21 in which a substrate insertion section 23 having a main-substrate side connecting part 26 composed of signal lines 24 at its peripheral edge is formed, a sub-substrate 30 made of material the same as that for the main substrate 21 into the same thickness, having a formed pattern of a sub-substrate side connecting part 34 composed of signal lines 33, inserted into the insertion section 23 and attached replaceably and removably in the same plane as the main substrate 21, a connection board 40 for bringing signal lines 41 into contact with the connecting part 26 and the connecting part 34 to connect them electrically, and a device connecting part 32 which a connector 13 is inserted into and is electrically connected to the sub-substrate 30. COPYRIGHT: (C)2006,JPO&NCIPI
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