发明名称 |
OSCILLATION TESTER OF PIEZOELECTRIC OSCILLATING DEVICE, MANUFACTURING EQUIPMENT, AND OSCILLATION TEST METHOD |
摘要 |
PROBLEM TO BE SOLVED: To reliably detect oscillations of piezoelectric oscillating devices. SOLUTION: In an oscillation tester 1, an oscillation test circuit is constituted of an electric power source supply part 10 for supplying electric power supply for an oscillator 4; an oscillation input part 11 for inputting an oscillation signal of a crystal oscillator 2 from the oscillator 4; an oscillation detecting part 12 for detecting the oscillation signal inputted to the oscillation input part 11; a determination control part 13 for determining the presence or absence of oscillations of the crystal oscillator 2 on the basis of the presence or absence of the detection of the oscillation signal in a determination time; and a time setting part 14 for setting an inspection time for inspecting the state of oscillation of the oscillation signal. An ON time for supplying electric power supply for the oscillator 4 and an OFF time for not supplying electric power supply for the oscillator 4 are set in the time setting part 14. The ON time is continuously constituted of a determination latency time for waiting for the detection of the oscillation signal and a determination time of detecting the oscillation signal. COPYRIGHT: (C)2006,JPO&NCIPI
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申请公布号 |
JP2006023082(A) |
申请公布日期 |
2006.01.26 |
申请号 |
JP20040198726 |
申请日期 |
2004.07.06 |
申请人 |
DAISHINKU CORP |
发明人 |
INAMI YOSHIMI |
分类号 |
G01R29/22;H03B5/32;H03H3/02 |
主分类号 |
G01R29/22 |
代理机构 |
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主权项 |
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地址 |
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