发明名称 |
Topography and recognition imaging atomic force microscope and method of operation |
摘要 |
A recognition force microscope for detecting interactions between a probe and a sensed agent on a scanned surface and methods for its operation are provided. The microscope includes a scanning probe having a tip that is sensitive to a property of the scanned surface, and the probe is adapted to oscillate with a low mechanical Q factor. Operation of the microscope includes recording the displacement of the probe tip as a function of time and simultaneously recording both topographic images and the spatial location of interactions between said probe and one or more sensed agents on the surface.
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申请公布号 |
US2006016251(A1) |
申请公布日期 |
2006.01.26 |
申请号 |
US20050152827 |
申请日期 |
2005.06.14 |
申请人 |
HINTERDORFER PETER;NELSON JEREMY;LINDSAY STUART M |
发明人 |
HINTERDORFER PETER;NELSON JEREMY;LINDSAY STUART M. |
分类号 |
G01B11/30;G01Q10/06;G01Q60/42 |
主分类号 |
G01B11/30 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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