发明名称 X-RAY MEASURING APPARATUS
摘要 <p><P>PROBLEM TO BE SOLVED: To provide an X-ray measuring apparatus capable of correcting nonuniformity caused by a filter and providing a favorable three-dimensional image. <P>SOLUTION: This X-ray measuring apparatus is provided with an X-ray source 101 generating X-rays irradiating an examinated object 108, an X-ray detector 102 detecting measurement data on the examinated object 108, a retainer 103 retaining the opposed X-ray source 101 and the X-ray detector 102, a rotating device 104 changing the relative position of the X-ray source 101 and the X-ray detector 102 to the examined object 108, and a control processor 106 computing the measurement data. This apparatus is characterized in that a filter 110 having a cross sectional shape formed by combining a recessed arc, a projecting arc and a straight line together is installed between the X-ray source 101 and the examinated object 108, and while the rotating device 104 rotates, the X-ray source 101 generates the X-rays and the X-ray detector 102 collects the measurement data. <P>COPYRIGHT: (C)2006,JPO&NCIPI</p>
申请公布号 JP2006020680(A) 申请公布日期 2006.01.26
申请号 JP20040198987 申请日期 2004.07.06
申请人 HITACHI MEDICAL CORP 发明人 BABA RIKA;UEDA TAKESHI
分类号 A61B6/03;G01N23/04;G01T1/00;G01T1/17;G21K3/00;G21K5/02 主分类号 A61B6/03
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