发明名称 METHOD FOR FORMING POLYSILICON BASED THIN FILM, AND METHOD FOR MANUFACTURING DISPLAY
摘要 PROBLEM TO BE SOLVED: To solve a problem in a method for forming a polysilicon based thin film by scanning an amorphous silicon based thin film formed on an insulating substrate with a pulse laser that a cicle time is long because high temperature dehydrogenation processing is required for a several hour. SOLUTION: An amorphous silicon based thin film containing hydrogen by 7 atomic% or less is formed on an insulating substrate by catalyst CVD and irradiated with a pulse laser as dehydrogenation processing. Subsequently, the amorphous silicon based thin film is irradiated with a pulse laser and crystallized, thus forming a polysilicon based thin film. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006024736(A) 申请公布日期 2006.01.26
申请号 JP20040201383 申请日期 2004.07.08
申请人 SEIKO INSTRUMENTS INC 发明人 SENBONMATSU SHIGERU;SUGINOYA MITSURU;YAMAMOTO SHUHEI;MATSUMURA HIDEKI;MASUDA ATSUSHI
分类号 H01L21/20;H01L21/205;H01L21/336;H01L29/786 主分类号 H01L21/20
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