发明名称 |
METHOD FOR FORMING POLYSILICON BASED THIN FILM, AND METHOD FOR MANUFACTURING DISPLAY |
摘要 |
PROBLEM TO BE SOLVED: To solve a problem in a method for forming a polysilicon based thin film by scanning an amorphous silicon based thin film formed on an insulating substrate with a pulse laser that a cicle time is long because high temperature dehydrogenation processing is required for a several hour. SOLUTION: An amorphous silicon based thin film containing hydrogen by 7 atomic% or less is formed on an insulating substrate by catalyst CVD and irradiated with a pulse laser as dehydrogenation processing. Subsequently, the amorphous silicon based thin film is irradiated with a pulse laser and crystallized, thus forming a polysilicon based thin film. COPYRIGHT: (C)2006,JPO&NCIPI
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申请公布号 |
JP2006024736(A) |
申请公布日期 |
2006.01.26 |
申请号 |
JP20040201383 |
申请日期 |
2004.07.08 |
申请人 |
SEIKO INSTRUMENTS INC |
发明人 |
SENBONMATSU SHIGERU;SUGINOYA MITSURU;YAMAMOTO SHUHEI;MATSUMURA HIDEKI;MASUDA ATSUSHI |
分类号 |
H01L21/20;H01L21/205;H01L21/336;H01L29/786 |
主分类号 |
H01L21/20 |
代理机构 |
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主权项 |
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地址 |
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