发明名称 |
Bonding configuration structure for facilitating electrical testing in a bonding process and a testing method using the same |
摘要 |
A bonding configuration structure for facilitating electrical testing in a bonding process and a testing method are provided. The bonding configuration includes a bonded component, a bonding component, a bond portion and a leading component. The bonding component is disposed on the bonded component. The bonding component has a first end and a second end. The first end is coupled to the bond portion. The second end is disposed on the bonded component to form the first testing portion.
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申请公布号 |
US2006017448(A1) |
申请公布日期 |
2006.01.26 |
申请号 |
US20050049158 |
申请日期 |
2005.02.02 |
申请人 |
AU OPTRONICS CORP. |
发明人 |
CHEN HUI-CHANG;LEE CHUN-YU |
分类号 |
B23K31/12;G01R1/073;G01R27/02;G01R31/01;G01R31/04 |
主分类号 |
B23K31/12 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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