发明名称 Bonding configuration structure for facilitating electrical testing in a bonding process and a testing method using the same
摘要 A bonding configuration structure for facilitating electrical testing in a bonding process and a testing method are provided. The bonding configuration includes a bonded component, a bonding component, a bond portion and a leading component. The bonding component is disposed on the bonded component. The bonding component has a first end and a second end. The first end is coupled to the bond portion. The second end is disposed on the bonded component to form the first testing portion.
申请公布号 US2006017448(A1) 申请公布日期 2006.01.26
申请号 US20050049158 申请日期 2005.02.02
申请人 AU OPTRONICS CORP. 发明人 CHEN HUI-CHANG;LEE CHUN-YU
分类号 B23K31/12;G01R1/073;G01R27/02;G01R31/01;G01R31/04 主分类号 B23K31/12
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