发明名称 CAPACITIVE SINGLE-ELECTRON TRANSISTOR
摘要 <p>The invention is a sensitive measuring instrument, which is principally applied to quantum computation, especially to measurement of quantum bits consisting of superconducting micro and nano-structures. The state of a quantum bit is expressed as the voltage-time integral over a circuit component. Phase measurement is performed by measuring the capacitance of a single-electron transistor between the gate and ground.</p>
申请公布号 WO2006008335(A1) 申请公布日期 2006.01.26
申请号 WO2005FI00331 申请日期 2005.07.18
申请人 TEKNILLINEN KORKEAKOULU;HAKONEN, PERTTI;ROSCHIER, LEIF;SILLANPAEAE, MIKA 发明人 HAKONEN, PERTTI;ROSCHIER, LEIF;SILLANPAEAE, MIKA
分类号 H01L39/22;G06N99/00;H01L 主分类号 H01L39/22
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