<p>The invention is a sensitive measuring instrument, which is principally applied to quantum computation, especially to measurement of quantum bits consisting of superconducting micro and nano-structures. The state of a quantum bit is expressed as the voltage-time integral over a circuit component. Phase measurement is performed by measuring the capacitance of a single-electron transistor between the gate and ground.</p>
申请公布号
WO2006008335(A1)
申请公布日期
2006.01.26
申请号
WO2005FI00331
申请日期
2005.07.18
申请人
TEKNILLINEN KORKEAKOULU;HAKONEN, PERTTI;ROSCHIER, LEIF;SILLANPAEAE, MIKA