| 摘要 |
Method of detecting at least one sample region using a laser scanning microscope by means of a relative movement between the illumination light and the sample via first scanning means along at least one scanning axis substantially perpendicular to the illumination axis, wherein several illuminated sample points lie on a line and several points are detected simultaneously with a locally resolving detector, wherein second scanning means are moved at an angle to the plane of the relative movement, preferably perpendicular thereto, and an image is recorded, in that the movement of the first and second scanning means is coupled and a three-dimensional scanning movement is performed by virtue of the illumination in the sample, and wherein the second scanning means coupled to the movement of the first scanning means are moved in such a manner that straight and/or curved lines and/or planar and/or curved surfaces are scanned which are extended along at least one scanning direction of the first scanning means and along the scanning direction of the second scanning means.
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