发明名称 Semiconductor Physical Quality Sensor
摘要 An inexpensive, accurate, and reliable semiconductor physical quantity sensor having improved resistance to noise is provided, wherein pads that have been pulled down to ground inside a semiconductor chip are arranged closer to a ground pad, while pads and that have been pulled up to a power supply inside the chip are arranged closer to a power supply pad. Of the digital input/output pads that have undergone digital trimming to obtain a predetermined output, the pulled-down pads and the ground pad are electrically connected to a ground terminal outside the chip via internal exposed portions, wires, and a ground-connecting external wire. The pulled-up pads and the power supply pad are electrically connected to a power supply terminal outside the chip via the internal exposed portions, the wires, and a power-supply-connecting external wire. Terminals may be electrically connected together on a package or a mounting substrate.
申请公布号 GB2374676(A8) 申请公布日期 2006.01.25
申请号 GB20020000358 申请日期 2002.01.09
申请人 发明人
分类号 G01L9/00;G01L9/04;G01P1/02;G01P15/08;G01P15/12;H01L29/84 主分类号 G01L9/00
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