发明名称 |
Method for fabricating a III nitride film, an underlayer for fabricating a III nitride film and a method for fabricating the same underlayer |
摘要 |
A method for fabricating a Group III nitride film is provided, including the steps of preparing a substrate, forming an underfilm and then forming the Group III nitride film on the underfilm. The underfilm is a Group III nitride including at least 50 atomic percent of elemental Al for each of the Group III elements of the underfilm Group III nitride. The surface of the underfilm includes a contoured portion and a flat region, and less than 50% of the surface is occupied by the flat region.
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申请公布号 |
US6989202(B2) |
申请公布日期 |
2006.01.24 |
申请号 |
US20040891340 |
申请日期 |
2004.07.14 |
申请人 |
NGK INSULATORS, LTD. |
发明人 |
ASAI KEIICHIRO;SHIBATA TOMOHIKO;NAKAMURA YUKINORI;TANAKA MITSUHIRO |
分类号 |
B32B9/00;C23C16/02;C23C16/30;C30B25/18;H01L21/20;H01L21/205;H01L33/12;H01L33/16;H01L33/22;H01L33/32 |
主分类号 |
B32B9/00 |
代理机构 |
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代理人 |
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地址 |
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