Testing arrangement for optical devices

摘要

A measuring setup for measuring an optical device under test-DUT-includes an optical signal source for applying an optical signal to the DUT, and an optical receiver unit for measuring a response of the DUT on the applied signal. A measurement unit is coupled between the optical signal source and the optical receiver unit. The measurement unit comprises an optical circuit to provide optical signals from and/or to the DUT for measuring the DUT, whereby the optical circuit comprises optical components showing high susceptibility to mechanical noise. A shielding unit receives the optical circuit and provides at least partial shielding of the optical circuit and/or the DUT against mechanical noise.