发明名称 Lateral high-breakdown-voltage transistor having drain contact region
摘要 A lateral high-breakdown-voltage transistor comprises an n<SUP>-</SUP> drain region and an n<SUP>+</SUP> source region formed in a p<SUP>-</SUP> silicon substrate, separated from each other, a gate electrode formed on a channel, insulated from the substrate, an n+ drain contact region formed in the drain region, drain wiring electrically connected to the drain region via the drain contact region, a p<SUP>+</SUP> substrate contact region formed in contact with the source region, and source wiring electrically connected to the source region and also connected to the semiconductor layer via the substrate contact region. The transistor is characterized in that the substrate contact regions have respective portions made to be in contact with the source wiring, and accordingly laterally extend from inside the contact surface of the source wiring to outside the contact surface.
申请公布号 US6989568(B2) 申请公布日期 2006.01.24
申请号 US20030748187 申请日期 2003.12.31
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 WATANABE KIMINORI;MATSUOKA KEISUKE;ITO TAKAO
分类号 H01L29/76;H01L29/06;H01L29/08;H01L29/10;H01L29/739;H01L29/78;H01L29/94;H01L31/062;H01L31/113;H01L31/119 主分类号 H01L29/76
代理机构 代理人
主权项
地址