| 摘要 |
Provided is directed to a semiconductor memory device including a control path for enabling a sense generator signal for delaying time as long as a bitline sense amplifier operates in response to a row active signal and enabling a precharge signal according to the sense generator signal, wherein the control path includes: a first time control unit for varying an enabling time of the sense generator signal by each time, according to a special test mode signal for testing the semiconductor memory device and a specific column address; and a second time control unit for varying an enabling time of the precharge signal by each step, according to a special test mode signal for testing the semiconductor memory device and a specific column address.
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