发明名称 SEMICONDUCTOR MANUFACTURING APPARATUS CONTROL SYSTEM
摘要 To reduce a stop time of transportation of wafers which occurs when one stepper handles many kinds of products, before exposure of semiconductor wafers of a first cassette port 7 a is completed, a process recipe for semiconductor wafers of a second cassette port 7 b is obtained from a host computer 2, the progress of the exposure of the semiconductor wafers of the first cassette port 7 a is detected via a sequencer 5, it is determined, based on the obtained process recipe, whether or not the semiconductor wafers of the second cassette port 7 b can be transported to an exposure stage following the last semiconductor wafer of the first cassette port 7 a, and a stepper 1 is caused to perform exposure in accordance with the determination result and the progress detection result.
申请公布号 KR100545620(B1) 申请公布日期 2006.01.24
申请号 KR20037004620 申请日期 2003.03.31
申请人 发明人
分类号 H01L21/027;G03F7/20;H01L21/00;H01L21/66 主分类号 H01L21/027
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