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发明名称
SEMICONDUCTOR MEMORY DEVICE WITH TEST MODE
摘要
申请公布号
KR100543226(B1)
申请公布日期
2006.01.20
申请号
KR20030034364
申请日期
2003.05.29
申请人
发明人
分类号
G01R31/28;G11C11/413;G11C29/00;G11C29/12;G11C29/26
主分类号
G01R31/28
代理机构
代理人
主权项
地址
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