发明名称 ANALYZER
摘要 PROBLEM TO BE SOLVED: To provide an analyzer constituted so as to prevent the adhesion of the scattered matter from a container 12 to an optical system 36, when the container 12 is irradiated with a laser beam L from the optical system 36 of a laser beam irradiation means 24. SOLUTION: The container 12 is irradiated with the laser beam L condensed by the optical system 36 of the laser beam irradiation means 24. The fluorescence, emitted by irradiating the container 12 with the laser beam L, is condensed, and an element is determinated from the condensed fluorescence. A flat plate-shaped shield plate 40, having a passing hole 41 for permitting the laser beam L to pass, is arranged between the optical system 36 of the laser beam irradiation means 24 and the container 12. The adhesion of the scattered matter from the container 12, which is irradiated with the condensed laser beam L, to the optical system 36 is prevented by the shielding plate 40, to enable long-term stable analysis. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006017620(A) 申请公布日期 2006.01.19
申请号 JP20040196845 申请日期 2004.07.02
申请人 TOSHIBA CORP;TOSHIBA ELECTRON TUBES & DEVICES CO LTD 发明人 OTANI RYOICHI
分类号 G01N21/64 主分类号 G01N21/64
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