发明名称 SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF
摘要 PROBLEM TO BE SOLVED: To crystallize polycrystalline silicon with superior crystallinity, and prevent the bend of a substrate due to a high crystallization temperature at the time of crystallization at the same time. SOLUTION: A manufacturing method includes a stage of depositing a silicon film containing amorphous silicon on a substrate by a PECVD process or a LPCVD process, a stage of forming a polycrystalline silicon film by performing the heat treatment of the silicon film in an H<SB>2</SB>O atmosphere below a fixed temperature, a stage of forming a gate insulating film at the upper part of the polycrystalline silicon film, a stage of defining source/drain regions by forming an impurity region in the polycrystalline silicon film, and a stage of activating the impurity region. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006019698(A) 申请公布日期 2006.01.19
申请号 JP20050079277 申请日期 2005.03.18
申请人 SAMSUNG SDI CO LTD 发明人 KAKKAD RAMESH;KIM YONG-SEOG
分类号 H01L29/786;H01L21/20;H01L21/265;H01L21/336 主分类号 H01L29/786
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