发明名称 METHOD OF EVALUATING EVENNESS OF SUPLATAST TOSILATE CRYSTAL, EVEN CRYSTAL, AND PROCESS FOR PRODUCING THE SAME
摘要 <p>A method of evaluating the evenness of suplatast tosilate crystals; and stable crystals having evenness in optical purity. The method of evaluating the evenness of suplatast tosilate crystals is characterized by comprising (a) a step in which a solvent is added to the suplatast tosilate crystals to dissolve up to 3% of the crystals and part of the supernatant of the resultant suspension is taken out and examined for optical purity and (b) a step in which a solvent is then added to the remaining suspension to dissolve the whole crystals and part of the solution is taken out and examined for optical purity, and by comparing the optical purity obtained in the step (a) with that obtained in the step (b). Suplatast tosilate crystals excellent in evenness and thermal stability are provided.</p>
申请公布号 WO2006006616(A1) 申请公布日期 2006.01.19
申请号 WO2005JP12893 申请日期 2005.07.13
申请人 TAIHO PHARMACEUTICAL CO., LTD.;USHIO, TAKANORI;NAGAI, KEIKO 发明人 USHIO, TAKANORI;NAGAI, KEIKO
分类号 G01N21/21;C07C381/12;A61K31/167;A61P37/08;G01N23/20 主分类号 G01N21/21
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