CONTACT PROBE FOR A TESTING HEAD

摘要

The invention describes a contact probe (40) for a testing head effective to test a plurality of semiconductor-integrated electronic devices. The contact probe (40) comprises a rod-like probe body (41) having cross section of prefixed contour and provided in correspondence with at least one end with an eccentric contact tip (P). Advantageously, according to the invention, the contact tip (P) is positioned within the contour of the cross section of the probe body. The invention also describes a testing head having vertical probes comprising a plurality of contact probes (40) with eccentric contact tips (P), as well as a method for realising a contact probe with an eccentric contact tip.