发明名称 Projection objective having a high aperture and a planar end surface
摘要 A projection objective for imaging a pattern provided in an object plane of the projection objective onto an image plane of the projection objective suitable for microlithography projection exposure machines has a plurality of optical elements transparent for radiation at an operating wavelength of the projection objective. At least one optical element is a high-index optical element made from a high-index material with a refractive index n>=1.6 at the operating wavelength.
申请公布号 US2006012885(A1) 申请公布日期 2006.01.19
申请号 US20050151465 申请日期 2005.06.14
申请人 CARL ZEISS SMT AG 发明人 BEDER SUSANNE;SINGER WOLFGANG;SCHUSTER KARL-HEINZ
分类号 G02B3/00 主分类号 G02B3/00
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