| 摘要 |
<p><P>PROBLEM TO BE SOLVED: To solve the problem that an inspection method for inspecting a memory (ROM/RAM) built in an LSI is incapable of precisely inspecting the delay malfunction because the access path to the memory is different from that of the normal operation (operational condition in a product incorporating the LSI) of the LSI. <P>SOLUTION: The semiconductor integrated circuit is provided with the memory having the ROM 2001 and the RAM 2002 storing a command code and data and a controller 2000 for fetching and decoding the command code stored in the memory, for executing a command, and for reading or writing the data for the memory, wherein the controller 2000 includes a correction code generation circuit 3004 for generating another dummy command code different from the command code stored in the memory, and executes the command according to the dummy command code when the memory inspection is performed. <P>COPYRIGHT: (C)2006,JPO&NCIPI</p> |
