发明名称 SYSTEM MICROSCOPE
摘要 PROBLEM TO BE SOLVED: To provide a system microscope capable of easily performing the focusing control of an inverted microscope and an erect microscope. SOLUTION: The system microscope has the inverted microscope 100 having an observation optical system including an objective 4 to acquire the observed image of a sample 3 from the downside of a stage 2 on which the sample 3 is placed, and the erect microscope 200 having an observation optical system including an objective 28 to acquire the observed image of the sample 3 from the upside of the stage 2. Then, an AF part is arranged in the observation optical system of the inverted microscope 100, so as to control the focusing of the observation optical systems of the inverted microscope 100 and the erect microscope 200 based on the result of focus detection by the AF part. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006017814(A) 申请公布日期 2006.01.19
申请号 JP20040192974 申请日期 2004.06.30
申请人 OLYMPUS CORP 发明人 KONO TAKAYUKI;KOYAMA KENICHI;TSUCHIYA ATSUHIRO
分类号 G02B21/18;G02B21/36 主分类号 G02B21/18
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