发明名称 CMOS leakage current meter
摘要 A leakage current detection circuit is provided comprising a first field effect transistor, the transistor configured to be biased to provide a leakage current, and a first current mirror in communication with the transistor operable to detect the leakage current from the transistor when the transistor is biased to provide the leakage current.
申请公布号 US2006012391(A1) 申请公布日期 2006.01.19
申请号 US20050039743 申请日期 2005.01.19
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD. 发明人 HUANG CHIEN-HUA
分类号 G01R31/26 主分类号 G01R31/26
代理机构 代理人
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