发明名称
摘要 An apparatus and method for inspecting electronic component orientation along with x-ray verification of connection integrity is presented. An comprises providing an electronic component 100 for surface mount integration and providing an x-ray visible orientation indicator 300, 402, 500, 600 for the electronic component 100 such that proper orientation of the electronic component 100 is verifiable by x-ray inspection after performing surface mount integration of the electronic component. The x-ray inspection also makes connection integrity of the electronic component 100 verifiable.
申请公布号 JP2006502557(A) 申请公布日期 2006.01.19
申请号 JP20030541052 申请日期 2002.10.29
申请人 发明人
分类号 H01L21/60;H01L23/498;H01L23/544;H05K1/02;H05K3/00;H05K3/30;H05K3/34 主分类号 H01L21/60
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