发明名称 Multi step electrodeposition process for reducing defects and minimizing film thickness
摘要 The present invention relates to a method for forming a planar conductive surface on a wafer. In one aspect, the present invention uses a no-contact process with electrochemical deposition, followed by a contact process with electrochemical mechanical deposition.
申请公布号 US2006011485(A1) 申请公布日期 2006.01.19
申请号 US20050232026 申请日期 2005.09.20
申请人 BASOL BULENT M;UZOH CYPRIAN E;TALIEH HOMAYOUN 发明人 BASOL BULENT M.;UZOH CYPRIAN E.;TALIEH HOMAYOUN
分类号 C25D5/10;C25D5/02;C25D5/22;C25D7/12;H01L21/288;H01L21/768 主分类号 C25D5/10
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