发明名称 METHOD OF DETERMINING EXPOSURE CONDITIONS, EXPOSURE METHOD, EXPOSURE APPARATUS, AND METHOD OF PRODUCING DEVICE
摘要 <p>Pattern images are projected under various conditions of liquid prior to exposing a substrate, and exposure conditions for exposing a pattern image on the substrate is determined based on each projection condition of the pattern images. When a pattern image is projected through liquid, a substrate can be excellently exposed in a desired exposure condition according to the condition of the liquid.</p>
申请公布号 WO2006006562(A1) 申请公布日期 2006.01.19
申请号 WO2005JP12764 申请日期 2005.07.11
申请人 NIKON CORPORATION;FUJIWARA, TOMOHARU 发明人 FUJIWARA, TOMOHARU
分类号 H01L21/027;G03F7/20 主分类号 H01L21/027
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