发明名称 ANALYZING APPARATUS, ANALYSIS PROGRAM, AND ANALYSIS METHOD
摘要 PROBLEM TO BE SOLVED: To provide an analyzing apparatus allowing an operator to easily set a fraction region. SOLUTION: The analyzing apparatus comprises a measurement data acquiring means for acquiring first and second measurement data from an analyte, a two-dimensional distribution map creating means for creating a two-dimensional distribution map showing a distribution of a tangible component included in the analyte using the first and second measurement data as the axes, a region setting means for setting the fraction region on the two-dimensional distribution map, a frequency distribution map creating means for creating a frequency distribution map employing the first measurement data as the axis of the tangible component belonging to the fraction region set by the region setting means, and an output means for outputting the two-dimensional distribution map and the frequency distribution map. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006017497(A) 申请公布日期 2006.01.19
申请号 JP20040193428 申请日期 2004.06.30
申请人 SYSMEX CORP 发明人 MIYAMOTO KIMIYO
分类号 G01N33/49;G01N33/48 主分类号 G01N33/49
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