发明名称 Low-temperature plasma-enhanced chemical vapor deposition of silicon-nitrogen-containing films
摘要 A method for low-temperature plasma-enhanced chemical vapor deposition of a silicon-nitrogen-containing film on a substrate. The method includes providing a substrate in a process chamber, exciting a reactant gas in a remote plasma source, thereafter mixing the excited reactant gas with a silazane precursor gas, and depositing a silicon-nitrogen-containing film on the substrate from the excited gas mixture in a chemical vapor deposition process. In one embodiment of the invention, the reactant gas can contain a nitrogen-containing gas to deposit a SiCNH film. In another embodiment of the invention, the reactant gas can contain an oxygen-containing gas to deposit a SiCNOH film.
申请公布号 US2006014399(A1) 申请公布日期 2006.01.19
申请号 US20040891301 申请日期 2004.07.14
申请人 TOKYO ELECTRON LIMITED 发明人 JOE RAYMOND
分类号 H01L21/31;H01L21/469 主分类号 H01L21/31
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