| 发明名称 |
Externally-loaded weighted random test pattern compression |
| 摘要 |
The present invention is directed to a logic testing architecture with an improved decompression engine and a method of decompressing scan chains for testing logic circuits.
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| 申请公布号 |
US2006015787(A1) |
申请公布日期 |
2006.01.19 |
| 申请号 |
US20040891618 |
申请日期 |
2004.07.15 |
| 申请人 |
NEC LABORATORIES AMERICA, INC. |
发明人 |
WANG SEONGMOON;CHAKRADHAR SRIMAT T. |
| 分类号 |
G01R31/28 |
主分类号 |
G01R31/28 |
| 代理机构 |
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| 主权项 |
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