发明名称 Planarization apparatus
摘要 In the planarization apparatus (10), an etching stage (22) is installed in a body (12) where a rough grinding stage (18) and a finishing grinding stage (20) are disposed, and the rough grinding, finishing grinding, and etching of a wafer (28) are performed in the same planarization apparatus (10). A chuck (32, 36, 38, 40) for holding the wafer (28) is moved in an order through the rough grinding stage (18), the finishing grinding stage (20) and the etching stage (22) while keeping holding the wafer (28). When the chuck (32, 36, 38, 40) is positioned at the etching stage (22), the chuck (32, 36, 38, 40) is moved up toward an etching vessel (25) and the wafer (28) that is held by the chuck (32, 36, 38, 40) is housed in the etching vessel (25). In this state, etching solution (92) is projected on the wafer (28) from a nozzle (94) and the wafer (28) is etched.
申请公布号 EP1107289(A3) 申请公布日期 2006.01.18
申请号 EP20000125826 申请日期 2000.11.24
申请人 TOKYO SEIMITSU CO.,LTD. 发明人 HONDA, KATSUO
分类号 H01L21/00;B24B7/22;B24B37/00;B24B41/00;H01L21/304;H01L21/306 主分类号 H01L21/00
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