Method for acquisition of at least one region of interest with a light scanning microscope having a linear illumination

摘要

The method detects at least one sample region using a light pattern microscope (1) by means of relative movement between the irradiating light and the sample by a first scanner, along at least one scan axis essentially perpendicular to the irradiation axis. Several illuminated sample points lie on the same line and can be simultaneously detected with the locating detector. A second scanner is moved at an angle to the plane of relative movement, preferably perpendicular thereto. This results in an image recording in which the movement of the first and second scanners are coupled resulting in a three-dimensional scanning movement through the illumination in the sample. Independent claims also cover use of the method.