发明名称 BAKING APPARATUS HAVING WAFER DETECTING SYSTEM
摘要 <p>A semiconductor manufacturing apparatus includes a wafer guide, and a wafer detecting system to determine whether a wafer is properly seated on a hot plate, by detecting temperature variations for the hot plate when the wafer is positioned onto the hot plate.</p>
申请公布号 KR20060005546(A) 申请公布日期 2006.01.18
申请号 KR20040054386 申请日期 2004.07.13
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 PARK, CHAN HOON;LEE, JONG HAW;KIM, SANG SIK;PARK, KWANG YOUNG;LEE, KWANG HO;CHYUN, KI HYUN
分类号 H01L21/027 主分类号 H01L21/027
代理机构 代理人
主权项
地址