发明名称 |
Methods and apparatus for identification and imaging of specific materials |
摘要 |
A method for analyzing materials in an object includes acquiring x-ray projection data of the object at high energy and at low energy for a plurality of views. The acquired x-ray projection data is utilized in a material decomposition to determine material densities at each pixel for two selected basis materials. A composition of an object at each pixel is determined utilizing a determined mapping of material density regions for the two selected basis materials. An image indicative of the composition of the object is displayed utilizing the determined composition.
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申请公布号 |
US6987833(B2) |
申请公布日期 |
2006.01.17 |
申请号 |
US20030687131 |
申请日期 |
2003.10.16 |
申请人 |
GENERAL ELECTRIC COMPANY |
发明人 |
DU YANFENG;TKACZYK JOHN ERIC |
分类号 |
G01N23/087;A61B6/00;A61B6/03;H05G1/64 |
主分类号 |
G01N23/087 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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