发明名称 Methods and apparatus for identification and imaging of specific materials
摘要 A method for analyzing materials in an object includes acquiring x-ray projection data of the object at high energy and at low energy for a plurality of views. The acquired x-ray projection data is utilized in a material decomposition to determine material densities at each pixel for two selected basis materials. A composition of an object at each pixel is determined utilizing a determined mapping of material density regions for the two selected basis materials. An image indicative of the composition of the object is displayed utilizing the determined composition.
申请公布号 US6987833(B2) 申请公布日期 2006.01.17
申请号 US20030687131 申请日期 2003.10.16
申请人 GENERAL ELECTRIC COMPANY 发明人 DU YANFENG;TKACZYK JOHN ERIC
分类号 G01N23/087;A61B6/00;A61B6/03;H05G1/64 主分类号 G01N23/087
代理机构 代理人
主权项
地址