| 摘要 |
A test structure is for a circuit ( 20 ) includes a scan configuration module ( 26 ), including routing circuitry ( 28 ) and control ( 30 ). The routing circuitry ( 28 ), under control of control circuitry ( 30 ) can be configured to route scan test signals to various scan core modules ( 36 ) over a selected number of input scan ports SI(N-1:0) and output scan ports SO(N-1:0). Thus, the number of scan ports used can be varied depending upon the tester being used.
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