发明名称 Method and probe structure for implementing a single probe location for multiple signals
摘要 A method and a probe structure are provided for implementing multiple signals probing of a printed circuit board. A probe structure is formed on an outside surface of the printed circuit board. A resistor is electrically connected with an associated via with a signal to be monitored. A path to a predefined probe location for monitoring the signal is defined from the resistor using the probe structure.
申请公布号 US6987397(B2) 申请公布日期 2006.01.17
申请号 US20030682132 申请日期 2003.10.09
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 BARTLEY GERALD KEITH;DAHLEN PAUL ERIC;GERMANN PHILIP RAYMOND;MAKI ANDREW B.;MAXSON MARK OWEN
分类号 G01R31/02;G01R1/073;G01R31/28;H05K3/22 主分类号 G01R31/02
代理机构 代理人
主权项
地址