发明名称 SYSTEMS AND METHODS FOR NON-CONTACT MEASURING SPUTTERING TARGET THICKNESS USING ULTRASONICS
摘要 A method and apparatus for ultrasonically measuring the thickness of sputter targets of varying shapes. An immersion bubble (32) and transducer (36) provide pulses to a front surface (24) and a front surface/bonded surface (26) interface of a target. The pulses generate reflected echoes that are converted to electric signals. By measuring the difference in time that the electric signals occur the thickness of the target may be approximated to identify whether the thickness of the target is appropriate for use. The system includes a sputter track (15), specimen (20), chuck (28), nozzle (34), columns (60), opening (62), inlet (70), cable (58), gauge (59), turret (90), position (92), remote PC controller (110), electrical line (112), and rear part (84).
申请公布号 KR20060004956(A) 申请公布日期 2006.01.16
申请号 KR20057020172 申请日期 2005.10.24
申请人 TOSOH SMD, INC. 发明人 LEYBOVICH ALEXANDER
分类号 G01B17/02;C23C14/34;G01D5/48 主分类号 G01B17/02
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