发明名称 METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a manufacturing method for performing microfabrication using a hard mask when manufacturing a semiconductor using a low dielectric constant insulation film for an interlayer insulating film. SOLUTION: When working a low dielectric constant insulation film 13 and an etching stopper film 12 of its lower layer by applying the low dielectric constant insulation film 13 to a semiconductor, first of all, etching of a hard mask film 14 with a resist 15a as a mask is performed and continuously, ashing is performed on the resist 15a on conditions of a temperature higher than 200°C and a pressure around 1 Torr using H<SB>2</SB>and He mixed gases. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006013190(A) 申请公布日期 2006.01.12
申请号 JP20040189380 申请日期 2004.06.28
申请人 ROHM CO LTD 发明人 INUKAI KAZUAKI
分类号 H01L21/3065;G03F7/40;G03F7/42;H01L21/311;H01L21/768 主分类号 H01L21/3065
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