| 摘要 |
PROBLEM TO BE SOLVED: To mitigate or dissolve defects and problems regarding an invariance inspection used for circuit design. SOLUTION: One or more first steps of FSM corresponding to one or more bisection decision diagram (BDD) are executed. In order to retrieve a state space to an initial state and an error state in a second direction opposite to a first space, one or more second steps of FSM is executed and in order to retrieve the state space in the first direction by one or more first steps, one or more third steps of FSM are executed. COPYRIGHT: (C)2006,JPO&NCIPI
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