发明名称 ATOMIC LAYER DEPOSITED TANTALUM CONTAINING ADHESION LAYER
摘要 <p>Apparatus and methods of fabricating an atomic layer deposited tantalum containing adhesion layer within at least one dielectric material in the formation of a metal, wherein the atomic layer deposition tantalum containing adhesion layer is sufficiently thin to minimize contact resistance and maximize the total cross-sectional area of metal, including but not limited to tungsten, within the contact.</p>
申请公布号 WO2006004927(A1) 申请公布日期 2006.01.12
申请号 WO2005US23277 申请日期 2005.06.28
申请人 INTEL CORPORATION;JOHNSTON, STEVEN, W.;SPURGIN, KERRY;PETERSON, BRENNAN, L. 发明人 JOHNSTON, STEVEN, W.;SPURGIN, KERRY;PETERSON, BRENNAN, L.
分类号 H01L21/285;H01L21/768;(IPC1-7):H01L21/768 主分类号 H01L21/285
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