发明名称 POLYMER FOR RESIST COMPOSITION, POSITIVE RESIST COMPOSITION AND RESIST PATTERN FORMING METHOD
摘要 <P>PROBLEM TO BE SOLVED: To provide a polymer for a resist composition, a positive resist composition and a resist pattern forming method excellent in definition and resist pattern profiles, and to provide a polymer for a resist composition, a positive resist composition and a resist pattern forming method excellent in solubility in organic solvents and capable of reducing defect risk. <P>SOLUTION: The polymer for a resist composition comprises a structural unit (a1) derived from a (meth)acrylate containing an acid-dissociable dissolution inhibiting group, a structural unit (a2) derived from a (meth)acrylate containing a monocyclic or polycyclic lactone residue having no alkyl group, and a structural unit (a3) represented by general formula (3). <P>COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006008737(A) 申请公布日期 2006.01.12
申请号 JP20040183640 申请日期 2004.06.22
申请人 MITSUBISHI RAYON CO LTD 发明人 TAKESHITA MASARU;HAYASHI RYOTARO;IWAI TAKESHI;MOMOSE AKIRA;OTAKE ATSUSHI;UEDA TERUSHI;FUJIWARA TADAYUKI
分类号 C08F220/28;C08F220/12;G03F7/039;H01L21/027 主分类号 C08F220/28
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