发明名称 |
METHOD FOR MANUFACTURING LITHOGRAPHY MASK AND LITHOGRAPHY MASK |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a lithography mask which can suppress crystallization of ammonium sulfate when the mask is exposed by a high power exposure means such as an ArF excimer laser promoting production of foreign matter comprising ammonium sulfate, and to provide a method for manufacturing a lithography mask. <P>SOLUTION: A mask is cleaned by using a sulfuric acid-based detergent in a resist stripping and cleaning step (step 5) of a process of forming a half-transmitting part and in a resist stripping and cleaning step (step 10) of a process of forming a light shielding zone. The mask is then subjected to a sulfuric acid removing step for removing part or the entire surface layer portion where sulfate ion in a pattern is adsorbed so as to effectively remove the adsorbed sulfate ion. <P>COPYRIGHT: (C)2006,JPO&NCIPI |
申请公布号 |
JP2006011048(A) |
申请公布日期 |
2006.01.12 |
申请号 |
JP20040188157 |
申请日期 |
2004.06.25 |
申请人 |
HOYA CORP |
发明人 |
MORI JUNJI;TAKUSHIMA KATSUHIRO |
分类号 |
G03F1/32;G03F1/68;G03F1/82;G03F7/20;G03F7/42;H01L21/027;H01L21/304 |
主分类号 |
G03F1/32 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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