发明名称 METHOD FOR MANUFACTURING LITHOGRAPHY MASK AND LITHOGRAPHY MASK
摘要 <P>PROBLEM TO BE SOLVED: To provide a lithography mask which can suppress crystallization of ammonium sulfate when the mask is exposed by a high power exposure means such as an ArF excimer laser promoting production of foreign matter comprising ammonium sulfate, and to provide a method for manufacturing a lithography mask. <P>SOLUTION: A mask is cleaned by using a sulfuric acid-based detergent in a resist stripping and cleaning step (step 5) of a process of forming a half-transmitting part and in a resist stripping and cleaning step (step 10) of a process of forming a light shielding zone. The mask is then subjected to a sulfuric acid removing step for removing part or the entire surface layer portion where sulfate ion in a pattern is adsorbed so as to effectively remove the adsorbed sulfate ion. <P>COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006011048(A) 申请公布日期 2006.01.12
申请号 JP20040188157 申请日期 2004.06.25
申请人 HOYA CORP 发明人 MORI JUNJI;TAKUSHIMA KATSUHIRO
分类号 G03F1/32;G03F1/68;G03F1/82;G03F7/20;G03F7/42;H01L21/027;H01L21/304 主分类号 G03F1/32
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