发明名称 METHOD FOR WASHING SUBSTRATE SUBJECTED TO PLATING TREATMENT
摘要 PROBLEM TO BE SOLVED: To provide a cleaning method capable of washing away a plating solution stuck to the back face of a wafer immediately after plating treatment by a simple structure in a mass-production line including a face up type plating apparatus. SOLUTION: In the mass-production line including a face up type plating apparatus 3, a nozzle 21 for cleaning the back face of a wafer is arranged below a moving space in a robot 2 for taking out a wafer from the upper face of a wafer holder 4 at the lower part of the plating apparatus 3. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006009051(A) 申请公布日期 2006.01.12
申请号 JP20040183664 申请日期 2004.06.22
申请人 TDK CORP 发明人 SOTOZONO TAKEHIKO;ISOBE MITSUHARU;YODA TAKURO;ASAHARA HIDEKI
分类号 C25D21/08 主分类号 C25D21/08
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